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Proceedings Paper

Detector performance crystallinity and impurity study of cadmium zinc telluride crystals grown from the melt
Author(s): Haim Hermon; Michael M. Schieber; M. Factor; Tuviah E. Schlesinger; Ralph B. James; H. Yoon; Mark S. Goorsky
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Paper Abstract

A review of growth methods used to produce Cd1-xZnxTe (0.0<x<0.20) crystals for radiation detector applications is presented. Most of the results emphasize the high-pressure Bridgman (HPB) method. For selected melt- grown HPB ingots, the liquid/solid segregation coefficients of some impurities were measured. The correlation of the impurity content and nuclear detector performance will be discussed. Extended defects and surface and bulk crystallinity were measured using triple and double axis x- ray diffraction techniques (TAD and DAD XRD), X-ray topography, and infrared microscopy. X-ray diffraction maps and IR images were generated and compared to gamma-ray detector tests to correlate macroscopic defects with the nuclear detector responses. Defects states of CZT were also investigated using low-temperature photoluminescence spectroscopy. Comparisons between the material and detector properties for different CZT growth methods will be discussed.

Paper Details

Date Published: 18 December 2001
PDF: 17 pages
Proc. SPIE 4507, Hard X-Ray and Gamma-Ray Detector Physics III, (18 December 2001); doi: 10.1117/12.450757
Show Author Affiliations
Haim Hermon, Real Time Radiography Readout (Israel)
Michael M. Schieber, Hebrew Univ. of Jerusalem (Israel)
M. Factor, Real Time Radiography Readout (Israel)
Tuviah E. Schlesinger, Carnegie Mellon Univ. (United States)
Ralph B. James, Brookhaven National Lab. (United States)
H. Yoon, Univ. of California/Los Angeles (United States)
Mark S. Goorsky, Univ. of California/Los Angeles (United States)

Published in SPIE Proceedings Vol. 4507:
Hard X-Ray and Gamma-Ray Detector Physics III
Ralph B. James, Editor(s)

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