Share Email Print
cover

Proceedings Paper

Alpha particle response characterization of CdZnTe
Author(s): Mark S. Amman; Julie S. Lee; Paul N. Luke
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The coplanar-grid as well as other electron-only detection techniques are effective in overcoming some of the material problems of CdZnTe and, consequently, have led to efficient gamma-ray detectors with good energy resolution while operating at room temperature. The performance of these detectors is limited by the degree of uniformity in both electron generation and transport. Despite recent progress in the growth of CdZnTe material, small variations in these properties remain a barrier to the widespread success of such detectors. Alpha-particle response characterization of CdZnTe crystals fabricated into simple planar detectors is an effective tool to accurately study electron generation and transport. We have used a finely collimated alpha source to produce two-dimensional maps of detector response. A clear correlation has been observed between the distribution of precipitates near the entrance contact on some crystals and their alpha-response maps. Further studies are ongoing to determine the mechanism for the observed response variations and the reason for the correlation. This paper presents the results of these studies and their relationship to coplanar-grid gamma-ray detector performance.

Paper Details

Date Published: 18 December 2001
PDF: 11 pages
Proc. SPIE 4507, Hard X-Ray and Gamma-Ray Detector Physics III, (18 December 2001); doi: 10.1117/12.450742
Show Author Affiliations
Mark S. Amman, Lawrence Berkeley National Lab. (United States)
Julie S. Lee, Lawrence Berkeley National Lab. (United States)
Paul N. Luke, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 4507:
Hard X-Ray and Gamma-Ray Detector Physics III
Ralph B. James, Editor(s)

© SPIE. Terms of Use
Back to Top