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Proceedings Paper

Characterization of an x-ray laser beam
Author(s): Sebastien Le Pape; Philippe Zeitoun; Jorge J. G. Rocca; Antoine Carillon; Pierre Dhez; Marc Francois; S. Hubert; Mourad Idir; David Ros
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Paper Abstract

We report in this article the experimental and numerical tools, developed at the LSAI, for a complete characterization of an x-ray laser (XRL) beam. First, a Michelson interferometer has been used to realize a Fourrier transform spectroscopy experiment. A full comprehension of the measured linewidth requires a comparison of the XRL beam amplification in the plasma to raytrace simulation. Results of transient pumping XRL simulations are presented in this article. The last section is dedicated to a description of the XUV Shack-Hartmann wavefront sensor we have developed, and to the study of the capillary discharge XRL beam.

Paper Details

Date Published: 12 December 2001
PDF: 12 pages
Proc. SPIE 4505, Soft X-Ray Lasers and Applications IV, (12 December 2001); doi: 10.1117/12.450599
Show Author Affiliations
Sebastien Le Pape, Univ. Paris-Sud (France)
Philippe Zeitoun, Univ. Paris-Sud (France)
Jorge J. G. Rocca, Colorado State Univ. (United States)
Antoine Carillon, Univ. Paris-Sud (France)
Pierre Dhez, Univ. Paris-Sud (France)
Marc Francois, Univ. des Sciences et Technologies de Lille (France)
S. Hubert, CEA (France)
Mourad Idir, Univ. Paris-Sud (France)
David Ros, Univ. Paris-Sud (France)

Published in SPIE Proceedings Vol. 4505:
Soft X-Ray Lasers and Applications IV
Ernst E. Fill; Jorge J. G. Rocca, Editor(s)

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