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Proceedings Paper

Characterization of linear diattenuator and retarders using a two-modulator generalized ellipsometer (2-MGE)
Author(s): Gerald E. Jellison; C. Owen Griffiths; David Eugene Holcomb; Christopher M. Rouleau
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Paper Abstract

The two-modulator generalized ellipsometer (2-MGE) is a spectroscopic polarization-sensitive optical instrument that is sensitive to both standard ellipsometric parameters from isotropic samples as well as cross polarization terms arising from anisotropic samples. In reflection mode, teh 2-MGE has been used to measure the complex dielectric functions of several uniaxial crystals, including TiO2, ZnO, and BiI3. The 2-MGE can also be used in the transmission mode, in which the complete Mueller matrix of a sample can be determined (using 4 zone measurements). If the sample is a linear diattenuator and retarder, then only a single zone is required to determine the sample retardation, diattenuation, the principal axis direction, and the depolarization. These measurements have been performed in two different modes: 1) Spectroscopic, where the current wavelength limits are 260 to 850 nm, and 2) Spatially resolved (Current resolution ~30-50 microns) at a single wavelength. The latter mode results in retardation, linear diattenuation, and principal axis direction "maps" of the sample. Two examples are examined in this paper. First, a simple Polaroid film polarizer is measured, where it is seen that the device behaves nearly ideally in its design wavelength range (visible), but acts more as a retarder in the infrared. Second, congruently grown LiNbO3 is examined under bias. These results show that there are significant variations in the electric field-Pockels coefficient product within the material. Spectroscopic measurements are used to determine the dispersion of the r22 Pockels coefficient.

Paper Details

Date Published: 25 September 2002
PDF: 11 pages
Proc. SPIE 4819, Polarization Measurement, Analysis, and Applications V, (25 September 2002); doi: 10.1117/12.450409
Show Author Affiliations
Gerald E. Jellison, Oak Ridge National Lab. (United States)
C. Owen Griffiths, Hinds Instruments, Inc. (United States)
David Eugene Holcomb, Oak Ridge National Lab. (United States)
Christopher M. Rouleau, Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 4819:
Polarization Measurement, Analysis, and Applications V
Dennis H. Goldstein; David B. Chenault, Editor(s)

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