Share Email Print

Proceedings Paper

Polarization-entangled twin-photon ellipsometry
Author(s): Kimani C. Toussaint Jr.; Ayman F. Abouraddy; Matthew T. Corbo; Alexander V. Sergienko; Bahaa E. A. Saleh; Malvin C. Teich
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The high accuracy required in traditional ellipsometric measurements necessitates the absolute calibration of both the source and the detector. We demonstrate that these requirements can be circumvented by using a non-classical source of light, namely, a twin-photon polarization-entangled source that produces type-II spontaneous parametric down-conversion, in conjunction with a novel polarization interferometer and coincidence-counting detection scheme. Our scheme exhibits two features that obviate the requirements of a calibrated source and detector. The first is the twin-photon nature of the source; we are guaranteed, on the detection of a photon in one of the arms of the setup, that its twin will be in the other, effectively serving as calibration of the source. The second is that the polarization entanglement of the source serves as an interferometer, thereby alleviating the need for calibrating the detector. The net result is that absolute ellipsometric data from a sample may be obtained. We present preliminary experimental results showing how the technique operates.

Paper Details

Date Published: 25 September 2002
PDF: 10 pages
Proc. SPIE 4819, Polarization Measurement, Analysis, and Applications V, (25 September 2002); doi: 10.1117/12.450408
Show Author Affiliations
Kimani C. Toussaint Jr., Boston Univ. (United States)
Ayman F. Abouraddy, Boston Univ. (United States)
Matthew T. Corbo, Boston Univ. (United States)
Alexander V. Sergienko, Boston Univ. (United States)
Bahaa E. A. Saleh, Boston Univ. (United States)
Malvin C. Teich, Boston Univ. (United States)

Published in SPIE Proceedings Vol. 4819:
Polarization Measurement, Analysis, and Applications V
Dennis H. Goldstein; David B. Chenault, Editor(s)

© SPIE. Terms of Use
Back to Top