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Proceedings Paper

Current and ultimate limitations of scanning x-ray nanotomography
Author(s): Ian McNulty
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Paper Abstract

X-ray nanotomography has developed into a powerful new tool for three-dimensional structural analysis. The scanning approach offers capabilities that are competitive with full- field imaging. Current and ultimate limitations of nanotomography are examined in light of recent work.

Paper Details

Date Published: 13 December 2001
PDF: 6 pages
Proc. SPIE 4499, X-Ray Micro- and Nano-Focusing: Applications and Techniques II, (13 December 2001); doi: 10.1117/12.450234
Show Author Affiliations
Ian McNulty, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 4499:
X-Ray Micro- and Nano-Focusing: Applications and Techniques II
Ian McNulty, Editor(s)

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