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Proceedings Paper

Novel integrating solid state detector with segmentation for scanning transmission soft x-ray microscopy
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Paper Abstract

An integrating solid state detector with segmentation has been developed that addresses the needs in scanning transmission x-ray microscopy below 1 keV photon energy. The detector is not cooled and can be operated without an entrance window which leads to a total photon detection efficiency close to 100%. The chosen segmentation with 8 independent segments is matched to the geometry of the STXM to maximize image mode flexibility. In the bright field configuration for 1 ms integration time and 520 eV x-rays the rms noise is 8 photons per integration.

Paper Details

Date Published: 13 December 2001
PDF: 9 pages
Proc. SPIE 4499, X-Ray Micro- and Nano-Focusing: Applications and Techniques II, (13 December 2001); doi: 10.1117/12.450229
Show Author Affiliations
Michael Feser, SUNY/Stony Brook (United States)
Chris J. Jacobsen, SUNY/Stony Brook (United States)
Pavel Rehak, Brookhaven National Lab. (United States)
Gianluigi DiGeronimo, Brookhaven National Lab. (United States)
Peter Holl, KETEK GmbH (Germany)
Lothar Strueder, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)


Published in SPIE Proceedings Vol. 4499:
X-Ray Micro- and Nano-Focusing: Applications and Techniques II
Ian McNulty, Editor(s)

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