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Proceedings Paper

New XRMF spectrometer with high resolution and high efficiency using polycapillary x-ray lens and PSPC+
Author(s): Xunliang Ding; Yiming Yan; Qiuli Pan; Yumei Yan; Yejun He
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Paper Abstract

A new spectrometer based on plane crystal wavelength dispersive method using a position sensitive proportional counter (PSPC) in conjunction with x-ray microbeam formed by monolithic polycapillary x-ray focusing lens has been developed. The new spectrometer could be used for XRMF analysis with high sensitivity, high spatial resolution and energy resolution simultaneously. The minimum spot sizes of the Cu-K(alpha) focused by the lens was 50micrometers . The energy resolution of 5.8 eV was obtained for Ti-K(alpha) by means of the spectrometer.

Paper Details

Date Published: 13 December 2001
PDF: 7 pages
Proc. SPIE 4499, X-Ray Micro- and Nano-Focusing: Applications and Techniques II, (13 December 2001); doi: 10.1117/12.450221
Show Author Affiliations
Xunliang Ding, Beijing Normal Univ. (China)
Yiming Yan, Beijing Normal Univ. (China)
Qiuli Pan, Beijing Normal Univ. (China)
Yumei Yan, Beijing Normal Univ. (China)
Yejun He, Beijing Normal Univ. (China)


Published in SPIE Proceedings Vol. 4499:
X-Ray Micro- and Nano-Focusing: Applications and Techniques II
Ian McNulty, Editor(s)

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