Share Email Print
cover

Proceedings Paper

Complex permittivity and permeability characterization from transmission-line measurements
Author(s): Juan Hinojosa
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Two broadband methods for simultaneously measuring the complex values of the permittivity and permeability of film-shaped materials are presented. The complex properties of these materials are calculated from S-parameter measurements of coplanar or microstrip cells propagating the quasi-TEM dominant mode. The S-parameter measurements are easy to be implement. They are carried out from a network analyzer and on-wafer systems allowing different sizes of cell and covering 0.05-40 GHz. In the case of the coplanar, the dispersion is very low for a cell shape such as h>W+2S. Thus, a fast extraction method of the coplanar substrate properties ((epsilon) r,(mu) r ) has been developed from analytical relationships. It is faster than the microstrip extraction method, which requires a numerical method for a rigorous analysis of the microstrip cell in order to take into account the quasi-TEM mode dispersion. Measured (epsilon) r and (mu) r data for several materials are presented in the 0.05 GHz to 40 GHz frequency range. These methods show good agreement between measured and predicted values.

Paper Details

Date Published: 27 November 2001
PDF: 10 pages
Proc. SPIE 4491, Subsurface and Surface Sensing Technologies and Applications III, (27 November 2001); doi: 10.1117/12.450175
Show Author Affiliations
Juan Hinojosa, Univ. Politecnica de Cartagena (Spain)


Published in SPIE Proceedings Vol. 4491:
Subsurface and Surface Sensing Technologies and Applications III
Cam Nguyen, Editor(s)

© SPIE. Terms of Use
Back to Top