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Proceedings Paper

Noncontact microwave material characterization
Author(s): David Glay; Tuami Lasri; Ahmed Mamouni; Yves Leroy
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Paper Abstract

In this paper, a nondestructive method for the non-contact characterization of non-planar dielectric objects is presented. Traditionally, this kind of measurements is achieved by using spot-focused antennas associated to a vector automatic network analyzer. In this study, we propose a free space measurement system, fitted out with a classical horn antenna, which demonstrates its usefulness in many practical cases. The permittivity is computed from the reflection coefficient of metal-backed samples of different shapes at 2.45 GHz.

Paper Details

Date Published: 27 November 2001
PDF: 10 pages
Proc. SPIE 4491, Subsurface and Surface Sensing Technologies and Applications III, (27 November 2001); doi: 10.1117/12.450171
Show Author Affiliations
David Glay, Institut d'Electronique et de Microelectronique du Nord (France)
Tuami Lasri, Institut d'Electronique et de Microelectronique du Nord (France)
Ahmed Mamouni, Institut d'Electronique et de Microelectronique du Nord (France)
Yves Leroy, Institut d'Electronique et de Microelectronique du Nord (France)


Published in SPIE Proceedings Vol. 4491:
Subsurface and Surface Sensing Technologies and Applications III
Cam Nguyen, Editor(s)

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