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Proceedings Paper

Degradation of supersmooth surfaces for UV/EUV/x-ray applications in space
Author(s): Dirk-Roger Schmitt; Helmut H. Toebben; Gabriele A. Ringel; Peter Weissbrodt; Manfred Schrenk; L. Raupach; Erich J. Hacker
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Paper Abstract

For future spacecrafts a lot of new UV or x-ray instruments are proposed. To enhance resolution and reduce scattering, new optical materials with optical surfaces with a roughness range of about 0.1 nm, i.e. supersmooth surfaces will be used to build the optics of the instruments. Some of the spacecrafts or instruments will be operated in the Low Earth Orbits (LEO's) of the Space Shuttle or the International Space Station. The natural and induced space environment can damage spacecraft and instrument materials. Since the LDEF-EURECA- and D2-experiments and the recovery of the Hubbel Space Telescope solar arrays it is well known that a large group fo materials degrade under space conditions. However very few data are available from inflight experiments especially on supersmooth materials. To fill the gap, the Surface Effects Sample Monitor SESAM has been developed. This space flight instrument was designed to expose test materials to the conditions of space during flight missions. Also included in the experiment is an online Atomic Oxygen (ATOX) Measurement Facility to monitor the impact of the ATOX on the exposed samples. The experiment was flown on four missions. The results show a degradation of supersmooth samples under space conditions which has to taken in account for the design of future UV or X-ray instruments.

Paper Details

Date Published: 10 December 2001
PDF: 10 pages
Proc. SPIE 4498, UV/EUV and Visible Space Instrumentation for Astronomy and Solar Physics, (10 December 2001); doi: 10.1117/12.450075
Show Author Affiliations
Dirk-Roger Schmitt, Deutsches Zentrum fuer Luft- und Raumfahrt e.V. (Germany)
Helmut H. Toebben, Deutsches Zentrum fuer Luft- und Raumfahrt e.V. (Germany)
Gabriele A. Ringel, Deutsches Zentrum fuer Luft- und Raumfahrt e.V. (Germany)
Peter Weissbrodt, JENOPTIK Laser, Optik, Systeme GmbH (Germany)
Manfred Schrenk, JENOPTIK Laser, Optik, Systeme GmbH (Germany)
L. Raupach, JENOPTIK Laser, Optik, Systeme GmbH (Germany)
Erich J. Hacker, JENOPTIK Laser, Optik, Systeme GmbH (Germany)


Published in SPIE Proceedings Vol. 4498:
UV/EUV and Visible Space Instrumentation for Astronomy and Solar Physics
Oswald H. W. Siegmund; Silvano Fineschi; Mark A. Gummin, Editor(s)

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