Share Email Print

Proceedings Paper

Algorithms for correcting geometric distortions in delay-line anodes
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Time-delay anodes are typically used in conjunction with microchannel plates to provide photon counting and two- dimensional imaging. The anode and associated electronics are used to compute the centroid of the charge cloud from the microchannel plate stack. The computation is done in analog circuitry and reported as a digital value. The analog nature of the time-delay anode makes them susceptible to variations in the correlation between physical space and the reported digital value. These variations, both local and global, must be corrected as part of the data reduction of scientific data. If left uncorrected in spectral data, for example, these variations would result in inaccurate wavelength identifications and distorted spectral line profiles. This work describes successful algorithms for correcting the dominant distortions present in a time-delay anode; geometric (local) and thermal (global) distortions. These algorithms were developed as part of the data reduction pipelines for the Cosmic Origins Spectrograph (COS), a fourth generation instrument for the Hubble Space Telescope, and the Far Ultraviolet Spectroscopic Explorer (FUSE).

Paper Details

Date Published: 10 December 2001
PDF: 8 pages
Proc. SPIE 4498, UV/EUV and Visible Space Instrumentation for Astronomy and Solar Physics, (10 December 2001); doi: 10.1117/12.450073
Show Author Affiliations
Erik Wilkinson, Univ. of Colorado/Boulder (United States)
Steven Penton, Univ. of Colorado/Boulder (United States)
Stephane Beland, Univ. of Colorado/Boulder (United States)
John V. Vallerga, Univ. of California/Berkeley (United States)
Jason B. McPhate, Univ. of California/Berkeley (United States)
David J. Sahnow, Johns Hopkins Univ. (United States)

Published in SPIE Proceedings Vol. 4498:
UV/EUV and Visible Space Instrumentation for Astronomy and Solar Physics
Oswald H. W. Siegmund; Silvano Fineschi; Mark A. Gummin, Editor(s)

© SPIE. Terms of Use
Back to Top