Share Email Print
cover

Proceedings Paper

Fast-scanning near-field scanning optical microscopy using a high-frequency dithering probe
Author(s): Yongho Seo; Wonho Jhe
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We suggest two methods attaching tip to the quartz crystal resonator to be applied to a near-field optical scanning microscope probe. High-speed near-field scanning optical microscopy images obtained with the quartz crystal resonator probe are presented. We have achieved fast scanning imaging at the scanning speed of 1.3 mm/s without any compromise of spatial lateral resolution. Applying a concept of the acoustic wave, the topographic image of soft sample with the quartz crystal resonator probe is interpreted.

Paper Details

Date Published: 5 December 2001
PDF: 8 pages
Proc. SPIE 4456, Controlling and Using Light in Nanometric Domains, (5 December 2001); doi: 10.1117/12.449529
Show Author Affiliations
Yongho Seo, Seoul National Univ. (South Korea)
Wonho Jhe, Seoul National Univ. (South Korea)


Published in SPIE Proceedings Vol. 4456:
Controlling and Using Light in Nanometric Domains
Aaron Lewis; H. Kumar Wickramasinghe; Katharina H.B. Al-Shamery, Editor(s)

© SPIE. Terms of Use
Back to Top