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Proceedings Paper

Use of vector diffraction theory in theoretical and experimental investigation of SNOM tips
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Paper Abstract

An approach to the optical investigation of probes for scanning near-field optical microscopes (SNOM tips) and recognition of their near-field parameters by far-field measurements is considered. The comparison of approximate calculations of vector light field diffracted by a subwavelength aperture with more rigorous calculations of the light field passing through tapered end of a SNOM tip is presented. A numerical iterative procedure of the SNOM tip aperture reconstruction by the analytical continuation of the emerging light Fourier spectrum is presented. The approach is based on the use of plane waves covering a wide range of spatial frequencies. The results of experimental measurements and far-field data treatment with the definition of a subwavelength aperture are discussed.

Paper Details

Date Published: 5 December 2001
PDF: 12 pages
Proc. SPIE 4456, Controlling and Using Light in Nanometric Domains, (5 December 2001); doi: 10.1117/12.449528
Show Author Affiliations
Nikolay B. Voznesensky, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Vadim P. Veiko, St. Petersburg Institute of Fine Mechanics and Optics (Russia)

Published in SPIE Proceedings Vol. 4456:
Controlling and Using Light in Nanometric Domains
Aaron Lewis; H. Kumar Wickramasinghe; Katharina H.B. Al-Shamery, Editor(s)

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