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Proceedings Paper

Near fields scattered by small- and large-scale rough surfaces and lateral fluctuations in the permittivity and permeability of nanostructures
Author(s): Ezekiel Bahar
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Paper Abstract

The scattered electromagnetic near fields due to fluctuations in the surface height and/or lateral variations in the electromagnetic medium parameters are evaluated using a full wave approach. Since the scales of the height and medium fluctuations considered could be significantly smaller or larger than the electromagnetic wavelengths, the familiar perturbation and physical/geometrical optics solutions cannot be used nor is it possible to investigate sub-wavelength features based on far-field measurements. The full wave approach employs complete field expansion that include propagating and evanescent waves as well as lateral waves and surface waves. The lateral waves and surface waves are not accounted for in the perturbation and physical optics solutions. Unlike the physical optics and small perturbation approach, exact boundary conditions for the electric and magnetic fields are imposed at the rough interfaces. For irregular layered media the complete field expansions are associated with propagating and evanescent waves, the lateral wave term and surfaces waves guided by the stratified structure. The interfaces between the irregular stratified structures are not characterized by the approximate impedance boundary conditions. The modal expansions while complete, do not individually satisfy the correct boundary conditions, and they do not uniformly coverage the irregular boundaries, therefore term by term differentiation of the field expansions is avoided.

Paper Details

Date Published: 5 December 2001
PDF: 8 pages
Proc. SPIE 4456, Controlling and Using Light in Nanometric Domains, (5 December 2001); doi: 10.1117/12.449525
Show Author Affiliations
Ezekiel Bahar, Univ. of Nebraska/Lincoln (United States)

Published in SPIE Proceedings Vol. 4456:
Controlling and Using Light in Nanometric Domains
Aaron Lewis; H. Kumar Wickramasinghe; Katharina H.B. Al-Shamery, Editor(s)

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