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Proceedings Paper

Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry
Author(s): Carmen Sainz; Jose E. Calatroni; Rafael A. Escalona Z.
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Paper Abstract

Spectrally Resolved White Light Interferometry (SRWLI) is used for precise measurements of both the sample width and the differential refractive index, attaining precision of about 10-6 in the refractive index. This is achieved through the experimental simulation of a thin virtual cell about 40μm wide.

Paper Details

Date Published: 26 November 2001
PDF: 10 pages
Proc. SPIE 4448, Optical Diagnostics for Fluids, Solids, and Combustion, (26 November 2001); doi: 10.1117/12.449374
Show Author Affiliations
Carmen Sainz, Univ. Metropolitana (Venezuela)
Jose E. Calatroni, Univ. Simon Bolivar (Venezuela)
Rafael A. Escalona Z., Univ. Simon Bolivar (Venezuela)

Published in SPIE Proceedings Vol. 4448:
Optical Diagnostics for Fluids, Solids, and Combustion
Carolyn R. Mercer; Soyoung Stephen Cha; Gongxin Shen, Editor(s)

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