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Proceedings Paper

Low-coherence optical reflectometry of laser diode waveguides
Author(s): Christian Yves Boisrobert; Douglas L. Franzen; Bruce L. Danielson; David H. Christensen
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Paper Abstract

Laser diode waveguides are probed using low coherence optical reflectometry. Reflections from the launch optics, front facet, and rear facet are located with a resolution of approximately 10 micrometers . Diodes mounted in pigtailed packages and on chip carriers have been studied.

Paper Details

Date Published: 1 September 1991
PDF: 6 pages
Proc. SPIE 1474, Optical Technology for Signal Processing Systems, (1 September 1991); doi: 10.1117/12.44935
Show Author Affiliations
Christian Yves Boisrobert, National Institute of Standards and Technology (United States)
Douglas L. Franzen, National Institute of Standards and Technology (United States)
Bruce L. Danielson, National Institute of Standards and Technology (United States)
David H. Christensen, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 1474:
Optical Technology for Signal Processing Systems
Mark P. Bendett, Editor(s)

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