Share Email Print
cover

Proceedings Paper

Issues affecting the characterization of integrated optical devices subjected to ionizing radiation
Author(s): Robert K. Hickernell; Norman A. Sanford; David H. Christensen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We examine measurement issues which arise in the testing of integrated optical devices subjected to ionizing radiation. Many of these issues are not addressed by measurement procedures developed for optical fibers. We outline the complexities involved in the measurement of integrated optics as they relate to size, function, and materials. Pertinent waveguide parameters include attenuation, changes in refractive index, photorefractive effects, and polarization effects. Optical measurement techniques are reviewed, with particular attention paid to spatial and temporal resolution, dynamic range, and the capacity for remote measurement. Suggestions are made to improve the reliability of testing and allow better comparison between laboratories.

Paper Details

Date Published: 1 September 1991
PDF: 10 pages
Proc. SPIE 1474, Optical Technology for Signal Processing Systems, (1 September 1991); doi: 10.1117/12.44919
Show Author Affiliations
Robert K. Hickernell, National Institute of Standards and Technology (United States)
Norman A. Sanford, National Institute of Standards and Technology (United States)
David H. Christensen, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 1474:
Optical Technology for Signal Processing Systems
Mark P. Bendett, Editor(s)

© SPIE. Terms of Use
Back to Top