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Proceedings Paper

Performance of the SPring-8 modular piezoelectric bimorph mirror prototype
Author(s): Riccardo Signorato; Jean-Francois Carre; Tetsuya Ishikawa
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Paper Abstract

This paper reports on the performances of a test prototype mirror, based on the Piezoelectroic Bimorph Mirror technology, which has been designed and manufactured (in collaboration with the French optical company SESO) for the national Japanese 8 GeV storage ring Spring-8. The device consists of two 150 mm long modules assembled side-by-side. It exhibits superior surface quality with respect to previously manufactured long piezoelectric bimorph mirrors, as the junctions between modules do not introduce any distortion on the reflecting surface. The mirror can effectively compensate low frequency components of the figure error/waviness left by polishing. Two different simple optimisation methods have been validated: ex-situ in the metrology lab (Adaptive Optics correction and control algorithm) and, for the first time, in-situ at the beamline (Hartmann test). After optimisation with coherent x-rays at the 1 km long SPring-8 beamline, elliptical shaping was achieved with sub (mu) rad level precision for the slope error rms. The associated height error is as small as 8 nm rms. over 200 mm illuminated length. An extremely sharp gaussian 8 micrometers FWHM wide spot size was obtained by vertically demagnifying the undulator source. It has also been demonstrated that it is possible to bend the mirror to an arbitrary, user-defined, shape; i.e. sinusoidal.

Paper Details

Date Published: 14 November 2001
PDF: 12 pages
Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, (14 November 2001); doi: 10.1117/12.448501
Show Author Affiliations
Riccardo Signorato, SPring-8/RIKEN---The Institute of Physical and Chemical Research (Germany)
Jean-Francois Carre, Societe Europeenne des Systemes Optiques (France)
Tetsuya Ishikawa, SPring-8/RIKEN---The Institute of Physical and Chemical Research (Japan)

Published in SPIE Proceedings Vol. 4501:
X-Ray Mirrors, Crystals, and Multilayers
Andreas K. Freund; Tetsuya Ishikawa; Ali M. Khounsary, Editor(s)

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