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Proceedings Paper

Towards the preparation of optical surfaces preserving the coherence of hard x-ray beams
Author(s): Olivier Hignette; Christophe Peffen; Virginie Alvaro; Elia Chinchio; Andreas K. Freund
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Paper Abstract

The properties of optical components are described that are required by synchrotron x-ray scattering techniques needing to fully exploit the coherence properties of third- generation sources. For example, phase imaging and microfocusing applications require reflecting surfaces with errors much smaller than a nanometer up to spatial frequencies in the mm-1 range while keeping roughness on the sub-Angstrom level. The two major challenges being addressed in this paper are the accuracy of the metrology and the technology of the machining based on the metrology for deterministic corrections. The low emittance and the stability of the synchrotron source combined with x-ray position sensitive detectors are suitable to measure the reference wavefront with picometer accuracy. The deformation of this wavefront by a reflecting mirror leads to surface error maps whose accuracy corresponds to the conditions for coherence preservation. These maps are used as input for an ion-beam milling machine correcting these height errors on grazing incidence mirrors. First results are presented and limits of these techniques including possibilities of multilayer corrections are discussed.

Paper Details

Date Published: 14 November 2001
PDF: 11 pages
Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, (14 November 2001); doi: 10.1117/12.448497
Show Author Affiliations
Olivier Hignette, European Synchrotron Radiation Facility (France)
Christophe Peffen, European Synchrotron Radiation Facility (France)
Virginie Alvaro, European Synchrotron Radiation Facility (France)
Elia Chinchio, European Synchrotron Radiation Facility (France)
Andreas K. Freund, European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 4501:
X-Ray Mirrors, Crystals, and Multilayers
Andreas K. Freund; Tetsuya Ishikawa; Ali M. Khounsary, Editor(s)

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