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Proceedings Paper

Measurements of the integrated reflectivity of a mica crystal for different orders of reflection
Author(s): Sang Gon Lee; Jun Gyo Bak; Yeong Su Jung; Manfred Bitter; K. W. Hill; O. Wehrhan; Eckhart Foerster
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Paper Abstract

Simultaneous measurements of the integrated reflectivity of a mica crystal for different orders of reflection have been performed at a predefined Bragg angle of 45 degree(s) with use of a new method. The method is less time consuming than previous techniques and provides data with small statistical errors. It can be readily used for the calibration of x-ray crystal spectrometers. The paper presents experimental results for Bragg reflections up to the 22nd order. The obtained experimental results are compared with theoretical predictions.

Paper Details

Date Published: 14 November 2001
PDF: 8 pages
Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, (14 November 2001); doi: 10.1117/12.448492
Show Author Affiliations
Sang Gon Lee, Korea Basic Science Institute (South Korea)
Jun Gyo Bak, Korea Basic Science Institute (South Korea)
Yeong Su Jung, Korea Basic Science Institute (South Korea)
Manfred Bitter, Princeton Plasma Physics Lab. (United States)
K. W. Hill, Princeton Plasma Physics Lab. (United States)
O. Wehrhan, Friedrich-Schiller-Univ. Jena (Germany)
Eckhart Foerster, Friedrich-Schiller-Univ. Jena (Germany)


Published in SPIE Proceedings Vol. 4501:
X-Ray Mirrors, Crystals, and Multilayers
Andreas K. Freund; Tetsuya Ishikawa; Ali M. Khounsary, Editor(s)

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