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Proceedings Paper

High-resolution Al203/B4C multilayers
Author(s): Christian Morawe; Jean-Christophe Peffen; Eric Ziegler; Andreas K. Freund
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Paper Abstract

To fill the gap in energy resolution dE/E between a few percent for multilayer x-ray optics and a few 10-4 for perfect crystal optics we have developed narrow bandpass multilayers consisting of Al2O3 and B4C layers. Their resolving power was precisely determined on the ESRF bending magnet beamline BM5 using a white beam and a Si(111) analyzer crystal. Scans in the (n,+m) and in the (n,-m) scattering geometry return consistent results. With a sample of 680 double layers we have obtained a spectral resolution of 0.27% at energies around 12 keV which is in good agreement with earlier studies using monochromatic x-rays.

Paper Details

Date Published: 14 November 2001
PDF: 8 pages
Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, (14 November 2001); doi: 10.1117/12.448485
Show Author Affiliations
Christian Morawe, European Synchrotron Radiation Facility (France)
Jean-Christophe Peffen, European Synchrotron Radiation Facility (France)
Eric Ziegler, European Synchrotron Radiation Facility (France)
Andreas K. Freund, European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 4501:
X-Ray Mirrors, Crystals, and Multilayers
Andreas K. Freund; Tetsuya Ishikawa; Ali M. Khounsary, Editor(s)

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