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Proceedings Paper

Characterization of high-quality synthetic diamond crystals by um-resolved x-ray diffractometry and topography
Author(s): Joanna Hoszowska; Andreas K. Freund; Tetsuya Ishikawa; Jacques P.F. Sellschop; M. Rebak; R. C. Burns; J. O. Hansen; D. L. Welch; C. E. Hall
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Paper Abstract

We have conducted a systematic characterization of (111)- and (100)- oriented synthetic diamond crystals comparing the best presently available specimens of two types (Ib and IIa). The samples were grown by the two major diamond producers, namely the De Beers Industrial Diamonds (Pty) Ltd. in South Africa and the Sumitomo Electric Industries Ltd. in Japan. Double-crystal x-ray diffractometry with microscopic spatial resolution and x-ray topography were employed. The type IIa crystals showed much less pronounced defect structure than the Ib crystals for the (100)- orientation, but the (111) samples were comparable. A clear correlation between the distribution of nitrogen impurities in the Ib crystals and the defect structure was observed. The rocking curve widths from small regions of all specimens were very close to theoretical values on the arcsec level, whereas for larger sample areas they were broadened due to both local defects and crystal curvature. The quality of the IIa crystals from De Beers and Sumitomo was comparable.

Paper Details

Date Published: 14 November 2001
PDF: 12 pages
Proc. SPIE 4501, X-Ray Mirrors, Crystals, and Multilayers, (14 November 2001); doi: 10.1117/12.448483
Show Author Affiliations
Joanna Hoszowska, European Synchrotron Radiation Facility (France)
Andreas K. Freund, European Synchrotron Radiation Facility (France)
Tetsuya Ishikawa, SPring-8/RIKEN---The Institute of Physical and Chemical Research (Japan)
Jacques P.F. Sellschop, Univ. of the Witwatersrand (South Africa)
M. Rebak, De Beers Diamond Research Lab. (South Africa)
R. C. Burns, De Beers Diamond Research Lab. (South Africa)
J. O. Hansen, De Beers Diamond Research Lab. (South Africa)
D. L. Welch, De Beers Diamond Research Lab. (South Africa)
C. E. Hall, Drukker International B.V. (Netherlands)


Published in SPIE Proceedings Vol. 4501:
X-Ray Mirrors, Crystals, and Multilayers
Andreas K. Freund; Tetsuya Ishikawa; Ali M. Khounsary, Editor(s)

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