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Proceedings Paper

Ultrashort soft x-ray pulse-shape measurement using optical field ionization dynamics in noble gas
Author(s): Katsuya Oguri; Hidetoshi Nakano; Tadashi Nishikawa; Naoshi Uesugi
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Paper Abstract

We propose a cross-correlation technique for measuring the shape of an ultrashort soft x-ray-pulse using the rapid change in the Kr+ population that occurs during optical field-induced ionization. By calculating the time evolution of the Kr charge states during ionization, we showed that the increase in the Kr+ population operates as 'switch', and the transient state of Kr+ during the sequential ionization operates as 'sampling gate' for measuring a soft x-ray-pulse shape. The temporal resolution of this technique is expected to overcome the limitation imposed by the ionizing laser pulse duration as a result of the ultrafast nature of optical field-induced ionization. Using the 'switch' operation, we measured a soft x-ray-shape pulse are 15.6 nm emitted from W plasma produced by a 100-fs laser pulse. Assuming a Gaussian temporal profile, we found the soft x-ray-pulse duration to be about 4 ps. This result is in good agreement with the duration measured with an x-ray streak camera thus configuring the feasibility of this 'switch' operation. The 'sampling gate' operation will be useful for directly measuring the original pulse shape of a femtosecond soft x-ray.

Paper Details

Date Published: 14 November 2001
PDF: 8 pages
Proc. SPIE 4504, Applications of X Rays Generated from Lasers and Other Bright Sources II, (14 November 2001); doi: 10.1117/12.448475
Show Author Affiliations
Katsuya Oguri, NTT Basic Research Labs. (Japan)
Hidetoshi Nakano, NTT Basic Research Labs. (Japan)
Tadashi Nishikawa, NTT Basic Research Labs. (Japan)
Naoshi Uesugi, NTT Basic Research Labs. (Japan)

Published in SPIE Proceedings Vol. 4504:
Applications of X Rays Generated from Lasers and Other Bright Sources II
George A. Kyrala; Jean-Claude J. Gauthier, Editor(s)

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