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Proceedings Paper

Characteristics of neutron multilayer devices from ray-tracing calculations
Author(s): Anand M. Saxena
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Paper Abstract

Characteristics of a neutron focusing device based on five thin-film multilayers that are (1) oriented at slightly different angles with respect to the mean ray to converge the neutron beam reflected by each individual section, (2) have slightly different d-spacings such that the neutron beam reflected by each section has the same mean wavelength, were evaluated using a Monte Carlo program for a number of geometries. The influence of changing the distance between the focusing device and the detector was studied,and the effect of small deviations from the desired values was also explored.

Paper Details

Date Published: 8 November 2001
PDF: 13 pages
Proc. SPIE 4509, Neutron Optics, (8 November 2001); doi: 10.1117/12.448072
Show Author Affiliations
Anand M. Saxena, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 4509:
Neutron Optics
James L. Wood; Ian S. Anderson, Editor(s)

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