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Proceedings Paper

Refractive x-ray optics: step from focusing to interferometric devices
Author(s): Leonid Shabel'nikov; Igor A. Schelokov; Anatoly A. Snigirev; Irina Snigireva; Serguei Kuznetsov
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Paper Abstract

X-ray refractive optics is mainly concerned on a focusing devices. Another kinds of X-ray refractive devices with a new functionality, namely X-ray biprism and Michelsone echelon are considered. An experiment was fulfilled with biprism made from the synthetic diamond crystals on BM05 beamline ESRF. A computer simulation technique was developed to obtain interference patterns generated by the biprism with an account of a variety of experiment geometrical conditions, source size and absorption in biprism material. Recorded interference patterns were in a good agreement with the predicted ones for a given experimental conditions. Thus a complete description of a brightness distribution in source can be obtained by a reconstruction of the intensity distributions in interference fringes using the developed technique for investigation of synchrotron beams coherence. Possibilities of devices realisation with a extended functional capabilities by means of previously used microelectronic planar techniques are discussed.

Paper Details

Date Published: 21 November 2002
PDF: 10 pages
Proc. SPIE 4783, Design and Microfabrication of Novel X-Ray Optics, (21 November 2002); doi: 10.1117/12.447862
Show Author Affiliations
Leonid Shabel'nikov, Institute of Microelectronics Technology (Russia)
Igor A. Schelokov, Institute of Microelectronics Technology (Russia)
Anatoly A. Snigirev, European Synchrotron Radiation Facility (France)
Irina Snigireva, European Synchrotron Radiation Facility (France)
Serguei Kuznetsov, European Synchrotron Radiation Facility (France)

Published in SPIE Proceedings Vol. 4783:
Design and Microfabrication of Novel X-Ray Optics
Derrick C. Mancini, Editor(s)

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