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Proceedings Paper

Five-dimensional fluorescence microscopy
Author(s): Stephen E. D. Webb; D. S. Elson; Jan Siegel; Sandrine Leveque-Fort; Y. Gu; Duncan Parsons-Karavassilis; Mary J. Cole; Paul M. W. French; M. John Lever; Leon O. D. Sucharov; Mark A. A. Neil; Rimas Juskaitis; Tony Wilson
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Paper Abstract

We report a whole-field fluorescence imaging microscope that combines 3-D spatial resolution by optical sectioning, using structured illumination, with fluorescence lifetime imaging and spectrally-resolved imaging. We show the potential of this technique in the elimination of common artefacts in fluorescence lifetime imaging and apply it to study the dependence of the lifetime on the emission wavelength in biological tissue.

Paper Details

Date Published: 2 November 2001
PDF: 7 pages
Proc. SPIE 4431, Photon Migration, Optical Coherence Tomography, and Microscopy, (2 November 2001); doi: 10.1117/12.447405
Show Author Affiliations
Stephen E. D. Webb, Imperial College of Science, Technology and Medicine (United Kingdom)
D. S. Elson, Imperial College of Science, Technology and Medicine (United Kingdom)
Jan Siegel, Imperial College of Science, Technology and Medicine (United Kingdom)
Sandrine Leveque-Fort, Imperial College of Science, Technology and Medicine (United Kingdom)
Y. Gu, Imperial College of Science, Technology and Medicine (United Kingdom)
Duncan Parsons-Karavassilis, Imperial College of Science, Technology and Medicine (United Kingdom)
Mary J. Cole, Imperial Colleg of Science, Technology and Medicine (Germany)
Paul M. W. French, Imperial College of Science, Technology and Medicine (United Kingdom)
M. John Lever, Imperial College of Science, Technology and Medicine (United Kingdom)
Leon O. D. Sucharov, Univ. of Oxford (United Kingdom)
Mark A. A. Neil, Univ. of Oxford (United Kingdom)
Rimas Juskaitis, Univ. of Oxford (United Kingdom)
Tony Wilson, Univ. of Oxford (United Kingdom)


Published in SPIE Proceedings Vol. 4431:
Photon Migration, Optical Coherence Tomography, and Microscopy
Stefan Andersson-Engels; Michael F. Kaschke, Editor(s)

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