Share Email Print
cover

Proceedings Paper

Depth-scanning fringe projection: a new technique for absolute phase evaluation
Author(s): Robert Windecker; Klaus Koerner; Hans J. Tiziani
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Fringe projection is an often used optical technique for 3-D surface measurements of industrial and biological objects. Classical fringe projection has the disadvantage to determine the surface topgraphy in a quite small unambiguity range only. Gray code techniques are used to solve this problem, but the spatial resolution is reduced due to a small numerical aperture. In a new approach we want to extend the measurement range and we will increase the spatial and the vertical resolution too. This is achieved by a depth-scanning approach together with high numerical apertures for the illumination as well as for the detection. With the aid of an additional z-scanning stage either the object, the sensor, or the image plan are scanned to obtain data over the whole measurement volume. We call this technique depth-scanning fringe projection. It is especially advantageous for the measurement of medium sized objects and can achieve resolutions of less than 0.2micrometers .

Paper Details

Date Published: 30 October 2001
PDF: 8 pages
Proc. SPIE 4596, Advanced Photonic Sensors and Applications II, (30 October 2001); doi: 10.1117/12.447368
Show Author Affiliations
Robert Windecker, Univ. of Stuttgart (Germany)
Klaus Koerner, Univ. of Stuttgart (Germany)
Hans J. Tiziani, Univ. of Stuttgart (Germany)


Published in SPIE Proceedings Vol. 4596:
Advanced Photonic Sensors and Applications II

© SPIE. Terms of Use
Back to Top