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Proceedings Paper

Surface inspection using radon transform of projected grating patterns
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Paper Abstract

Carrier gratings are generally used to carry the spatial information about surfaces to be inspected and spatial information demodulated using phase shifting methods. Phase shifting methods need more than one image to demodulate the phase information and hence the spatial information of the object. In this paper we propose a method to inspect surfaces by projecting grating patterns on surfaces and Radon transforming the images. Fringe inclination is used as an estimator for locating surface defects.

Paper Details

Date Published: 30 October 2001
PDF: 8 pages
Proc. SPIE 4596, Advanced Photonic Sensors and Applications II, (30 October 2001); doi: 10.1117/12.447326
Show Author Affiliations
Krishnakumar Venkateswaran, New Jersey Institute of Technology and National Solar Observatory (United States)
Anand Krishna Asundi, Nanyang Technological Univ. (Singapore)


Published in SPIE Proceedings Vol. 4596:
Advanced Photonic Sensors and Applications II

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