Share Email Print

Proceedings Paper

Establishing calibration tolerances for a scanning seeker optical bench by correlating influence function and Code V analysis methods
Author(s): Brian J. Perona; Christopher L. Yarbrough
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

For production line manufacturing of Scanning Seekers, the optical train set-up, assembly, alignment and buy-off of optical parameters requires utilization of an automated Optical Test Bench by trained operators. Adjustment of the optical elements to obtain the specified seeker parameters, such as scan-diameter and focus, can be a time consuming iterative process if test errors and techniques of the test bench are not within sufficient accuracy limits of the end product specification. The periodic calibration of the opto- mechanical components is essential to ensure that all aspects of the test system are traceable to standards and the equipment itself has not become inflicted with random measurements errors. This paper covers the development of calibration limits and adjustment tolerances for an optical test bench using the methods of Influence Functions, analysis Code V2 and addressing the limitations of optical bench components.

Paper Details

Date Published: 5 November 2001
PDF: 10 pages
Proc. SPIE 4444, Optomechanical Design and Engineering 2001, (5 November 2001); doi: 10.1117/12.447314
Show Author Affiliations
Brian J. Perona, Raytheon Missile Systems Co. (United States)
Christopher L. Yarbrough, Raytheon Missile Systems Co. (United States)

Published in SPIE Proceedings Vol. 4444:
Optomechanical Design and Engineering 2001
Alson E. Hatheway, Editor(s)

© SPIE. Terms of Use
Back to Top