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Proceedings Paper

Flexural strength of sapphire: measurements performed at SoRI, UMass, and UDRI
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Paper Details

Date Published: 2 November 2001
PDF: 19 pages
Proc. SPIE 4452, Inorganic Optical Materials III, (2 November 2001); doi: 10.1117/12.446895
Show Author Affiliations
Claude A. Klein, c.a.k. analytics, inc. (United States)
Richard L. Gentilman, Materials Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 4452:
Inorganic Optical Materials III
Alexander J. Marker; Mark J. Davis, Editor(s)

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