Share Email Print

Proceedings Paper

Enhanced backscattering at grazing angle
Author(s): Zu-Han Gu; Mikael Ciftan
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The backscattering signal at small grazing angles is very important for vehicle re-entrance and missile tracking applications. It is also useful in FTIR grazing angle microscopy. Recently, we performed an experimental study of the far-field scattering at small grazing angles, especially the enhanced backscattering at grazing angles. For a randomly weak rough dielectric film on a reflecting metal substrate, a much larger enhanced backscattering peak is measured.

Paper Details

Date Published: 23 October 2001
PDF: 5 pages
Proc. SPIE 4447, Surface Scattering and Diffraction for Advanced Metrology, (23 October 2001); doi: 10.1117/12.446719
Show Author Affiliations
Zu-Han Gu, Surface Optics Corp. (United States)
Mikael Ciftan, U.S. Army Research Office (United States)

Published in SPIE Proceedings Vol. 4447:
Surface Scattering and Diffraction for Advanced Metrology
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

© SPIE. Terms of Use
Back to Top