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Proceedings Paper

Enhanced backscattering at grazing angle
Author(s): Zu-Han Gu; Mikael Ciftan
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Paper Abstract

The backscattering signal at small grazing angles is very important for vehicle re-entrance and missile tracking applications. It is also useful in FTIR grazing angle microscopy. Recently, we performed an experimental study of the far-field scattering at small grazing angles, especially the enhanced backscattering at grazing angles. For a randomly weak rough dielectric film on a reflecting metal substrate, a much larger enhanced backscattering peak is measured.

Paper Details

Date Published: 23 October 2001
PDF: 5 pages
Proc. SPIE 4447, Surface Scattering and Diffraction for Advanced Metrology, (23 October 2001); doi: 10.1117/12.446719
Show Author Affiliations
Zu-Han Gu, Surface Optics Corp. (United States)
Mikael Ciftan, U.S. Army Research Office (United States)


Published in SPIE Proceedings Vol. 4447:
Surface Scattering and Diffraction for Advanced Metrology
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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