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Proceedings Paper

Photoelastic modulation polarimetry and its measurement of twisted nematic liquid crystal
Author(s): Yu-Faye Chao; Andrew Lin; M. W. Wang
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Paper Abstract

For in situ/real time measurement, a retarder is substituted by a photoelastic modulator (PEM) in a polarimetry. The azimuthal position of the strain axis of PEM is directly determined with respect to the orientation of the transmission axis of polarizer and analyzer. The Mueller matrix of a twisted nematic liquid crystal (TN-LCD) is derived analytically. The phase retardation and the twisted angle of a TN-LCD are numerically obtained through two successive measurements of the Mueller polarimeter.

Paper Details

Date Published: 29 October 2001
PDF: 9 pages
Proc. SPIE 4595, Photonic Systems and Applications, (29 October 2001); doi: 10.1117/12.446589
Show Author Affiliations
Yu-Faye Chao, National Chiao Tung Univ. (Taiwan)
Andrew Lin, National Chiao Tung Univ. (United States)
M. W. Wang, National Chiao Tung Univ. (Taiwan)


Published in SPIE Proceedings Vol. 4595:
Photonic Systems and Applications

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