Share Email Print
cover

Proceedings Paper

Structural and thermal analysis of a new phase-change optical memory material: Ag-Sb-Te
Author(s): Yagya Deva Sharma; Chhavi Bhatnagar; Promod K. Bhatnagar
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Phase change optical recording disks using have been found to demonstrate long thermal stability of the amorphous recording marks. The thermal analysis of Ag-Sb-Te material was studied using DTA and structural analysis of the material were studied by x-ray diffraction, SEM and TEM respectively. The films were studied for both the cases: before and after annealing and it was concluded that the alloy could be used as a phase change optical memory material.

Paper Details

Date Published: 29 October 2001
PDF: 9 pages
Proc. SPIE 4594, Design, Fabrication, and Characterization of Photonic Devices II, (29 October 2001); doi: 10.1117/12.446584
Show Author Affiliations
Yagya Deva Sharma, Univ. of Delhi (India)
Chhavi Bhatnagar, Univ. of Delhi (India)
Promod K. Bhatnagar, Univ. of Delhi (India)


Published in SPIE Proceedings Vol. 4594:
Design, Fabrication, and Characterization of Photonic Devices II

© SPIE. Terms of Use
Back to Top