Share Email Print

Proceedings Paper

Improved calibration of an interference microscope
Author(s): Richard Koops
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The calibration of our interference microscope is currently performed by an elaborate multi step process. As a result the total uncertainty of a measurement performed with the interference microscope is much larger than the intrinsic repeatability of the microscope which is of the order of 1 nm. A major contribution to the total uncertainty is a length dependent factor, resulting from a calibration step using gauge blocks that finally yields 8 nm uncertainty for a step height of 2 micrometers . In order to reduce the total uncertainty we propose a novel step-height standard and calibration procedure. The standard is adjustable and can be simultaneously measured with the interference microscope and a laser interferometer allowing calibration of the entire dynamic range of the microscope with a single artefact. The new calibration method eliminates the process that contributes most to the total uncertainty budget in the current procedure. A possible implementation of the step-height standard is presented.

Paper Details

Date Published: 22 October 2001
PDF: 7 pages
Proc. SPIE 4401, Recent Developments in Traceable Dimensional Measurements, (22 October 2001); doi: 10.1117/12.445634
Show Author Affiliations
Richard Koops, NMi-Institute for Metrology and Technology (Netherlands)

Published in SPIE Proceedings Vol. 4401:
Recent Developments in Traceable Dimensional Measurements
Jennifer E. Decker; Nicholas Brown, Editor(s)

© SPIE. Terms of Use
Back to Top