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Proceedings Paper

Developments at NIST on traceability in dimensional measurements
Author(s): Dennis A. Swyt; Steven D. Phillips; John W. Palmateer
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Paper Abstract

This paper reports to the international community on recent developments in technical policies, programs, and capabilities at the U.S. (United States) National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to customers in calibration and measurement certificates, and a program to support the achievement of traceability to the SI (International System of Units) unit of length in dimensional measurements by manufacturers without direct recourse to a National Metrology Institute (NMI) for dimensional calibrations.

Paper Details

Date Published: 22 October 2001
PDF: 8 pages
Proc. SPIE 4401, Recent Developments in Traceable Dimensional Measurements, (22 October 2001); doi: 10.1117/12.445626
Show Author Affiliations
Dennis A. Swyt, National Institute of Standards and Technology (United States)
Steven D. Phillips, National Institute of Standards and Technology (United States)
John W. Palmateer, Boeing Co. (United States)


Published in SPIE Proceedings Vol. 4401:
Recent Developments in Traceable Dimensional Measurements

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