Share Email Print

Proceedings Paper

Automated interferometric system for bulge and blister test measurements of micromachined membranes
Author(s): Reda Yahiaoui; Kamran Danaie; Sylvain Petitgrand; Alain Bosseboeuf
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An experimental set-up designed for the mechanical characterization of small-size membranes by the bulge test and blister test techniques is described. The differential pressure (0-10 bars) is applied to the membrane with a motorized microsyringe pump filled with water to minimize stored elastic energy in the system. An interferometric microscope equipped with a quasi monochromatic Na discharge lamp, a CCD camera and an apertured photomultiplier is used to get simultaneously full field interferograms of the membrane deformed shape and a point measurement of the membrane central height variation. Phase extraction by FFT and unwrapping of the photomultiplier output signal, and processing of some pixels corresponding to the substrate in the set of interferograms images allows to get, with an accuracy in the 3-30 nm range, the true membrane maximum deflection corrected from substrate bending, vertical drift and tilting. 2D or 3D profiles of the membrane deformed shape can as well be obtained with a similar accuracy and a spatial resolution of 3micrometers . The good performances of the system are illustrated from measurements on micromachined Si3N4 and Mo membranes on silicon.

Paper Details

Date Published: 23 October 2001
PDF: 10 pages
Proc. SPIE 4400, Microsystems Engineering: Metrology and Inspection, (23 October 2001); doi: 10.1117/12.445600
Show Author Affiliations
Reda Yahiaoui, Univ. Paris-Sud XI (France)
Kamran Danaie, Univ. Paris-Sud XI (France)
Sylvain Petitgrand, Univ. Paris-Sud XI (France)
Alain Bosseboeuf, Univ. Paris-Sud XI (France)

Published in SPIE Proceedings Vol. 4400:
Microsystems Engineering: Metrology and Inspection

© SPIE. Terms of Use
Back to Top