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Proceedings Paper

In-line detection and evaluation of surface defects on thin metallic wires
Author(s): Juan Carlos Martinez-Anton; Philip Siegmann; Luis Miguel Sanchez-Brea; Eusebio Bernabeu; Jose Antonio Gomez-Pedrero; Hector A. Canabal
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Paper Abstract

We have developed a prototype for in-line detection of surface defects in metallic wires, specially for scratches. A simple geometrical relationship between surface topography and conical reflection, permits to correlate the defects with intensity patterns in a simple way. The presented apparatus consists basically in a grating-divided laser beam incident on angular equidistant points. A CCD and an associated optics capture the information of the whole wire perimeter at once. Analytic rudiments are provided in agreement with the experimental results.

Paper Details

Date Published: 3 October 2001
PDF: 8 pages
Proc. SPIE 4399, Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, (3 October 2001); doi: 10.1117/12.445586
Show Author Affiliations
Juan Carlos Martinez-Anton, Univ. Complutense de Madrid (Spain)
Philip Siegmann, Univ. Complutense de Madrid (Spain)
Luis Miguel Sanchez-Brea, Univ. Complutense de Madrid (Spain)
Eusebio Bernabeu, Univ. Complutense de Madrid (Spain)
Jose Antonio Gomez-Pedrero, Univ. Complutense de Madrid (Spain)
Hector A. Canabal, Univ. Complutense de Madrid (Spain)


Published in SPIE Proceedings Vol. 4399:
Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering

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