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Proceedings Paper

Moire interferometry using stuck foil-embossed diffraction grating
Author(s): Jaroslav Vaclavik; Jiri Minster; Roman Houha
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Paper Abstract

The replacement of the standard replication technique by gluing the pre-embossed foil grating for the use in moire interferometry is the concern of the article. The manufacturing of the pre-embossed foil diffraction grating is explained. Relations of the influence of the specimen surface profile to the zero interference field are derived. Some measurements of the profile of glued grating are shown including calculated extraneous interference field. Example of moire interferogram is shown using glued foil grating.

Paper Details

Date Published: 3 October 2001
PDF: 10 pages
Proc. SPIE 4399, Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, (3 October 2001); doi: 10.1117/12.445585
Show Author Affiliations
Jaroslav Vaclavik, SKODA Vyzkum Ltd. (Czech Republic)
Jiri Minster, Institute of Theoretical Applied Mechanics (Czech Republic)
Roman Houha, Optaglio Ltd. (Czech Republic)


Published in SPIE Proceedings Vol. 4399:
Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering

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