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Proceedings Paper

Digital holographic interferometry for characterization of transparent materials
Author(s): Pietro Ferraro; Sergio De Nicola; Andrea Finizio; Simonetta Grilli; Giovanni Pierattini
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Paper Abstract

Accurate measurement of the refractive index of solids is of great importance in various field of industrial processes. We present and discuss a method based on digital holographic interferometry for measuring refractive indices of transparent materials. Two recorded digital holograms are added producing a digital double exposure hologram. The numerical reconstruction of the interferogram intensity enables to determine the index of refraction of the sample under investigation. Advantages and limitations of the prosed approach are discussed.

Paper Details

Date Published: 3 October 2001
PDF: 8 pages
Proc. SPIE 4399, Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, (3 October 2001); doi: 10.1117/12.445580
Show Author Affiliations
Pietro Ferraro, Istituto Nazionale di Ottica Applicata (Italy)
Sergio De Nicola, Istituto di Cibernetica (Italy)
Andrea Finizio, Istituto di Cibernetica (Italy)
Simonetta Grilli, Istituto Nazionale di Ottica Applicata (Italy)
Giovanni Pierattini, Istituto di Cibernetica (Italy)


Published in SPIE Proceedings Vol. 4399:
Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering

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