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Proceedings Paper

Near-infrared linear birefringence measurement system using a photoelastic modulator
Author(s): Baoliang Bob Wang
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Paper Abstract

In this paper, the author reports a photoelastic modulator based linear birefringence measurement system (BMS) using a near IR laser . This instrument determines both the magnitude and angle of a birefringent sample without rotating the sample. It records birefringence images by scanning a sample that is mounted on a computer-controlled X-Y translation stage. The accuracy, repeatability and other key performance test for the NIR-BMS are provided in this report. Selected samples, including silicon optical components, a silicon wafer and waveplates commonly used at visible wavelengths, are studied using the NIR-BMS.

Paper Details

Date Published: 3 October 2001
PDF: 9 pages
Proc. SPIE 4399, Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, (3 October 2001); doi: 10.1117/12.445578
Show Author Affiliations
Baoliang Bob Wang, Hinds Instruments, Inc. (United States)


Published in SPIE Proceedings Vol. 4399:
Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering
Roland Hoefling; Werner P. O. Jueptner; Malgorzata Kujawinska, Editor(s)

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