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Proceedings Paper

Two-wavelength optical tomography system for industrial applications
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Paper Abstract

Optical tomography system utilizing two laser diode module lasing at 685 nm and 785 nm wavelengths is presented. During one scanning procedure about 8000 electronic transmission images of optically nonhomogeneous object are registered by us of CCD camera. Special prepared software based on modified Radon transform is applied in order to reconstruct of 3D structure of the object. Some examples of advantages of two-wavelength system in comparison with other systems are presented as well. As conclusions some specific industrial applications of the two-wavelength optical tomography system are discussed.

Paper Details

Date Published: 23 October 2001
PDF: 7 pages
Proc. SPIE 4398, Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design, (23 October 2001); doi: 10.1117/12.445566
Show Author Affiliations
Andrzej W. Domanski, Warsaw Univ. of Technology (Poland)
Miroslaw A. Karpierz, Warsaw Univ. of Technology (Poland)
Marek Wojciech Sierakowski, Warsaw Univ. of Technology (Poland)
Ryszard Swillo, Warsaw Univ. of Technology (Poland)
Tomasz R. Wolinski, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 4398:
Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design

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