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Proceedings Paper

Optical delay tester
Author(s): Shin-ichi Wakana; Toshiaki Nagai; Soichi Hama; Yoshiro Goto
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Paper Abstract

The authors have developed an optical delay tester based on electro-optic sampling, and designed a prototype to test the timing of high-speed IC chips. The device puts an electro-optic crystal in contact with the terminals to be tested and measures the voltage waveform applied to the crystal. Measurement precision is 100 mV or better and timing precision measurement is 50 ps.

Paper Details

Date Published: 1 August 1991
PDF: 8 pages
Proc. SPIE 1479, Surveillance Technologies, (1 August 1991); doi: 10.1117/12.44538
Show Author Affiliations
Shin-ichi Wakana, Fujitsu Labs. Ltd. (Japan)
Toshiaki Nagai, Fujitsu Labs. Ltd. (Japan)
Soichi Hama, Fujitsu Labs. Ltd. (Japan)
Yoshiro Goto, Fujitsu Labs. Ltd. (Japan)

Published in SPIE Proceedings Vol. 1479:
Surveillance Technologies
Sankaran Gowrinathan; Raymond J. Mataloni; Stanley J. Schwartz, Editor(s)

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