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Proceedings Paper

Nonthermally stabilized operation of a microbolometer for rapid turn-on
Author(s): Jonathan P. Knauth; Steven M. Balick
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Paper Abstract

Microbolometers respond to variations in impinging infrared energy through changes in the temperature of their thermally isolated detector structure. Thus, variations in the temperature of the substrate give rise to erroneous detector output variations. In order to minimize these effects, microbolometers are thermally stabilized using Peltier- junction coolers or heaters and operated and calibrated at a single temperature set point. This method provides the lowest thermal fluctuation noise at the expense of power consumption, waste heat generation and power-up readiness times often measured in minutes. This paper discusses strategies for providing rapid system readiness through non-thermally stabilized operation over a broad temperature range. A commercially available thermal imaging module which produces analog or digital images within 300 ms of power-up and operates without choppers, shutters or thermal stabilization has been demonstrated.

Paper Details

Date Published: 10 October 2001
PDF: 7 pages
Proc. SPIE 4369, Infrared Technology and Applications XXVII, (10 October 2001); doi: 10.1117/12.445294
Show Author Affiliations
Jonathan P. Knauth, Infrared Components Corp. (United States)
Steven M. Balick, Infrared Components Corp. (United States)

Published in SPIE Proceedings Vol. 4369:
Infrared Technology and Applications XXVII
Bjorn F. Andresen; Gabor F. Fulop; Marija Strojnik, Editor(s)

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