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Proceedings Paper

CCD performance model
Author(s): Oliver E. Dial
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Paper Abstract

The Charge Coupled Device (CCD) has become the preferred image sensor for visible wavelengths because of its sensitivity, low noise, wide dynamic range, and high resolution. Temperature, readout frequency, electronics, and signal processing affect CCD noise and dynamic range. A mathematical model of these effects is presented. The model uses CCD specifications, typically provided by the manufacturer at room temperature and video frequency, to predict performance at other operating conditions. CCD performance can be improved by operating at low temperatures and low readout frequencies and by the use of appropriate support electronics and signal processing. Lowering CCD temperature reduces dark shot noise, dark signal non-uniformity, and Johnson noise. Correlated double sampling compensates for reset noise. Lower readout frequencies permit lower noise-bandwidth amplifiers. Calibration can compensate for pixel non-uniformities. The CCD model developed here describes these effects to enable prediction of CCD performance as a function of operating conditions and signal processing options.

Paper Details

Date Published: 1 August 1991
PDF: 10 pages
Proc. SPIE 1479, Surveillance Technologies, (1 August 1991); doi: 10.1117/12.44514
Show Author Affiliations
Oliver E. Dial, Lockheed Missiles & Space Co., Inc. (United States)


Published in SPIE Proceedings Vol. 1479:
Surveillance Technologies
Sankaran Gowrinathan; Raymond J. Mataloni; Stanley J. Schwartz, Editor(s)

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