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Proceedings Paper

Measurement of loss and mode profile for integrated-optic waveguides using a camera
Author(s): Vikas Aggarwal; Sheel Aditya
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Paper Abstract

For integrated-optic waveguides, propagation loss and mode- profile are important parameters. In this work, a camera has been utilized to measure the propagation loss for planar waveguides and mode profile for channel waveguides. Measurements have been carried out on ion-exchange waveguides, at 633 nm and 1310 nm. The measured mode profiles have been used to calculate coupling loss between an optical fiber and channel waveguides. It is proposed that mode profile measurements may also be used for determining propagation loss of channel waveguides.

Paper Details

Date Published: 19 October 2001
PDF: 7 pages
Proc. SPIE 4579, Optical Fiber and Planar Waveguide Technology, (19 October 2001); doi: 10.1117/12.444910
Show Author Affiliations
Vikas Aggarwal, Indian Institute of Technology Delhi (India)
Sheel Aditya, Indian Institute of Technology Delhi (Singapore)

Published in SPIE Proceedings Vol. 4579:
Optical Fiber and Planar Waveguide Technology
Shuisheng Jian; Yanming Liu, Editor(s)

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