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Proceedings Paper

Dispersion measurement of tapered air-silica microstructure fiber by white-light interferometry
Author(s): Qinghao Ye; Chris Xu; Xiang Liu; Wayne H. Knox; Man F. Yan; Robert S. Windeler; Benjamin J. Eggleton
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Paper Abstract

Dispersion properties of the novel tapered air-silica microstructure fibers are measured between 1.3 and 1.65 micrometers by white-light interferometry. Dispersion values ((beta) 2) of -181 ps2/km and -152 ps2/km were obtained for 2.2 micrometers and 3 micrometers core sizes, respectively, at (lambda) equals1.55 micrometers .

Paper Details

Date Published: 19 October 2001
PDF: 5 pages
Proc. SPIE 4579, Optical Fiber and Planar Waveguide Technology, (19 October 2001); doi: 10.1117/12.444899
Show Author Affiliations
Qinghao Ye, Shanghai Jiaotong Univ. (United States)
Chris Xu, Lucent Technologies/Bell Labs. (United States)
Xiang Liu, Lucent Technologies/Bell Labs. (United States)
Wayne H. Knox, The Institute of Optics/Univ. of Rochester (United States)
Man F. Yan, Lucent Technologies/Bell Labs. (United States)
Robert S. Windeler, Lucent Technologies/Bell Labs. (United States)
Benjamin J. Eggleton, Lucent Technologies/Bell Labs. (United States)

Published in SPIE Proceedings Vol. 4579:
Optical Fiber and Planar Waveguide Technology
Shuisheng Jian; Yanming Liu, Editor(s)

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