Share Email Print

Proceedings Paper

0.50 µm contact measurement and characterization
Author(s): Tracy K. Lindsay; Kevin J. Orvek; Richard T. Mumaw
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A comparison of SEM measurements vs. electrical measurements of contact holes is presented. In-line SEM measurements on a Hitachi S6000 and measurements of micrographs from an off-line JEOL 845 SEM are compared to electrical measurements on a Prometrix LithoMapR system for metrology of contacts down to 0.25 micrometers size. The electrical measurements of contacts through focus/exposure variations on the stepper are shown to correlate very well with SEM measurements. Electrical measurement of contact holes in conductive films is shown to reflect actual process latitudes on oxide wafers, allowing electrical metrology to be used in optimizing lithography processes.

Paper Details

Date Published: 1 July 1991
PDF: 15 pages
Proc. SPIE 1464, Integrated Circuit Metrology, Inspection, and Process Control V, (1 July 1991); doi: 10.1117/12.44428
Show Author Affiliations
Tracy K. Lindsay, Digital Equipment Corp. (United States)
Kevin J. Orvek, Digital Equipment Corp. (United States)
Richard T. Mumaw, Prometrix Corp. (United States)

Published in SPIE Proceedings Vol. 1464:
Integrated Circuit Metrology, Inspection, and Process Control V
William H. Arnold, Editor(s)

© SPIE. Terms of Use
Back to Top