Share Email Print
cover

Proceedings Paper

Novel approach for high-speed convolution
Author(s): Cheol-Woo Kim; CheolKee Hong; Heung-Bo Shim
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Convolution of an image is indispensable in many image processing applications, but it is a time-consuming process. In general the convolution mask is restricted the size of 15 by 15 because of its computation time. Many approaches are attempted to reduce the convolution processing time using hardware and software algorithms. But they are restricted in specific application. In this paper, a novel approach is presented. This method is realized by simplifying the convolution process. The convolution mask is approximated and decomposed to more simple form, K convolutions with constant mask value respectively. K is the number of levels of approximation, which is less than or equal to (N+1)/2, where N is the original mask size. Calculation process is reconstructed to reduce recursive multiplications. And cumulative image, which contains sum of pixel values of the rectangle area from the origin to each pixel, is prepared for this process. Processing time is dramatically reduced and resulting image is similar to the one by original convolution mask. For 13 by 13 mask convolution, new method is above 20 times faster than conventional one.

Paper Details

Date Published: 5 October 2001
PDF: 8 pages
Proc. SPIE 4572, Intelligent Robots and Computer Vision XX: Algorithms, Techniques, and Active Vision, (5 October 2001); doi: 10.1117/12.444229
Show Author Affiliations
Cheol-Woo Kim, LG Electronics, Inc. (South Korea)
CheolKee Hong, LG Electronics, Inc. (South Korea)
Heung-Bo Shim, LG Electronics, Inc. (South Korea)


Published in SPIE Proceedings Vol. 4572:
Intelligent Robots and Computer Vision XX: Algorithms, Techniques, and Active Vision
David P. Casasent; Ernest L. Hall, Editor(s)

© SPIE. Terms of Use
Back to Top