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Proceedings Paper

Delta Haptic Device as a nanomanipulator
Author(s): Sebastien Grange; Francois Conti; Patrick Helmer; Patrice Rouiller; Charles Baur
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Paper Abstract

At the EPFL, we have developed a force-feedback device and control architecture for high-end research and industrial applications. The Delta Haptic Device (DHD) consists of a 6 degrees-of-freedom (DOF) mecatronic device driven by a PC. Several experiments have been carried out in the fields of manipulation and simulation to assess the dramatic improvement haptic information brings to manipulation. This system is particularly well suited for scaled manipulation such as micro-, nano- and biomanipulation. Not only can it perform geometric and force scaling, but it can also include fairly complex physical models into the control loop to assist manipulation and enhance human understanding of the environment. To demonstrate this ability, we are currently interfacing our DHD with an atomic force microscope (AFM). In a first stage, we will be able to feel in real-time the topology of a given sample while visualizing it in 3D. The aim of the project is to make manipulation of carbon nanotubes possible by including physical models of such nanotubes behavior into the control loop, thus allowing humans to control complex structures. In this paper, we give a brief description of our device and present preliminary results of its interfacing with the AFM.

Paper Details

Date Published: 8 October 2001
PDF: 12 pages
Proc. SPIE 4568, Microrobotics and Microassembly III, (8 October 2001); doi: 10.1117/12.444117
Show Author Affiliations
Sebastien Grange, Swiss Federal Institute of Technology/Lausanne (Switzerland)
Francois Conti, Swiss Federal Institute of Technology/Lausanne (United States)
Patrick Helmer, Swiss Federal Institute of Technology (Switzerland)
Patrice Rouiller, Swiss Federal Institute of Technology (Switzerland)
Charles Baur, Swiss Federal Institute of Technology (Switzerland)


Published in SPIE Proceedings Vol. 4568:
Microrobotics and Microassembly III
Bradley J. Nelson; Jean-Marc Breguet, Editor(s)

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